Research Mission

Future, autonomous NASA missions will require intelligence, adaptability, and fault-tolerance that only 3D, heterogeneous integrated nanosystems can provide. With this in mind, we have assembled four world-class groups, with expertise that spans nanoelectronics from basic materials to systems design and with a history of collaboration. The INAC will channel this expertise into a set of projects having well-defined objectives and metrics for success that can be evaluated in two years. Each of these projects is interdisciplinary in nature, requires a synergistic effort from multiple expertise groups, and addresses a key challenge in the development of integrated nanosystems.

We recognize that nanoelectronics is a fast-moving field where both projects and participants must evolve continuously in order to retain the cutting edge. A mechanism that will ensure this evolution while retaining their relevance to our vision is needed. With this in mind we have defined three research themes that address major challenges in the areas of nanoelectronics and sensing. The specific projects within these themes will evolve over the lifetime of the center.

Nanoelectronic Devices

  • Project 1: Carbon-Nanotube Based Devices
  • Project 2: Nanowire Transistors and Circuits
  • Project 3: Si-based Molecular Electronics

Integrated Sensors

  • Project 1: Cantilever-based biosensors
  • Project 2: Conductive-based chem./bio sensors
  • Project 3: Nanopores for single biomolecule sensing

Adaptive Systems

  • Project 1: Fault-tolerant, low-power computational approaches
  • Project 2: Biologically-inspired approaches for computation and communication
  • Project 3: Circuit approaches for nanoelectronics

Vertically Integrated Program

INAC participants provide a broad range of expertise. The vertically integrated program includes experimental and modeling efforts and allows the center to address problems at levels ranging from basic materials through system metrics. The areas of expertise include:

  • Materials growth and characterization
  • Devices
  • Fabrication/assembly
  • Circuits
  • Systems
  • Modeling/computation